The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Mar. 05, 2004
Applicants:

Nobutatsu Nakamura, Tokyo, JP;

Ryuichi Hiraike, Tokyo, JP;

Inventors:

Nobutatsu Nakamura, Tokyo, JP;

Ryuichi Hiraike, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a fault tolerant computing system, a number of processing nodes are connected via a communication channel to a management node. The management node has the function of setting the processing nodes in uniquely different configurations and operating the processing nodes in parallel to execute common application programs in parallel, so that the application programs are run under diversified environments. The management node has the function of respectively distributing request messages to the processing nodes. The configurations of the processing nodes are sufficiently different from each other to produce a difference in processing result between response messages when a failure occurs in one of the processing nodes. Alternatively, the management node has the function of selecting, from many processing nodes, those processing nodes which are respectively set in uniquely different configurations and operating the selected processing nodes in parallel to execute the common application programs.


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