The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Sep. 26, 2001
Edward V. Thomas, Albuquerque, NM (US);
Timothy J. Draelos, Albuquerque, NM (US);
Edward V. Thomas, Albuquerque, NM (US);
Timothy J. Draelos, Albuquerque, NM (US);
Sandia Corporation, Albuquerque, NM (US);
Abstract
A method of and system for authenticating concealed and statistically varying multi-dimensional data comprising: acquiring an initial measurement of an item, wherein the initial measurement is subject to measurement error; applying a transformation to the initial measurement to generate reference template data; acquiring a subsequent measurement of an item, wherein the subsequent measurement is subject to measurement error; applying the transformation to the subsequent measurement; and calculating a Euclidean distance metric between the transformed measurements; wherein the calculated Euclidean distance metric is identical to a Euclidean distance metric between the measurement prior to transformation.