The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

May. 28, 2004
Applicants:

Harlan Sexton, Palo Alto, CA (US);

Robert Lee, Sunnyvale, CA (US);

Peter Benson, Boulder, UT (US);

Inventors:

Harlan Sexton, Palo Alto, CA (US);

Robert Lee, Sunnyvale, CA (US);

Peter Benson, Boulder, UT (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and software for analyzing a heap is described, in which a snapshot is made of a heap, which can be later analyzed by an analysis tool when a program that had run out of memory is no longer running. In one embodiment, an object allocated by the program is accessed and copied into a file, and an address of the object allocated by the process is recorded in association with an offset in the file of the copy of the object. The copy of the object copied into the file has preferably the same size as the object allocated by the process. A heap analysis tool may then be run on the objects copied into the file.


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