The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Jun. 16, 2004
Ross E. Gough, Foothill Ranch, CA (US);
Steven Neal Rivkin, Laguna Niguel, CA (US);
Ross E. Gough, Foothill Ranch, CA (US);
Steven Neal Rivkin, Laguna Niguel, CA (US);
Western Digital Technologies, Inc., Lake Forest, CA (US);
Abstract
A subset of quality metrics as input to a disk drive failure prediction algorithm (DFPA) may be selected using a genetic algorithm. The DFPA is executed for an initially selected generation of subset quality metrics using quality metric values stored in a reference data base. At least one DFPA setting is adjusted and the DFPA executed again for the selected subset. After training the DFPA, the best DFPA setting is saved for the selected subset. A fitness score is generated for the selected subset, representing an accuracy of the DFPA relative to failure indicators stored in the reference data base. At least one genetic operator is applied in response to the fitness scores to generate a new generation of subsets. The process is repeated until a best subset of quality metrics and corresponding DFPA setting are found.