The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Mar. 17, 1999
Applicants:

Shoichi Koyama, Sayama, JP;

Yasunobu Fukushima, Sayama, JP;

Chuji Nakagawa, Sayama, JP;

Satoshi Sakamoto, Sayama, JP;

Inventors:

Shoichi Koyama, Sayama, JP;

Yasunobu Fukushima, Sayama, JP;

Chuji Nakagawa, Sayama, JP;

Satoshi Sakamoto, Sayama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A product quality information control method including the act of feeding repair information for making a repair based on imperfection information found during an inspection process of a product back to a manufacture control department. The repair information includes graphic and character information indicative of the contents of the repair made by a repair person. As a result, it becomes possible for the manufacture control department to accurately grasp an imperfection found by an inspection department and a temporary measure taken to cure the imperfection.


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Koyama, Shoichi. (2007). Product quality information control method and display system for such information (U.S. Patent No. 7236846). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7236846

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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