The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Sep. 10, 2002
Applicant:
Heinz H. Schreiber, Melbourne, FL (US);
Inventor:
Heinz H. Schreiber, Melbourne, FL (US);
Assignee:
Northrop Grumman Corporation, Los Angeles, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 7/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method includes communicating a first signal at a transmitter. The first signal has a first frequency. The method also includes receiving a second signal at a receiver. The second signal has a second frequency, and the second signal comprises the first signal converted from the first frequency to the second frequency. In addition, the method includes determining whether the transmitter and receiver are functional using at least one of the first and second signals.
Schreiber, Heinz. (2007). System and method for testing transceivers (U.S. Patent No. 7236778). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7236778
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile