The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Aug. 29, 2005
Applicant:

André Lalonde, Allen, TX (US);

Inventor:

André Lalonde, Allen, TX (US);

Assignee:

Finisar Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical test apparatus. The test apparatus includes an optical source. A first optical switch is connected to the optical source. An attenuated responsivity test path may be selectively coupled to the first optical switch. A return loss test path may alternatively be selectively coupled to the first optical switch. A second optical switch may be selectively coupled to the attenuated responsivity test path or the return loss test path. An optical splitter is connected to the second optical switch. The optical splitter is configured to connect to a ROSA. A detector is connected to the optical splitter. The detector is configured to connect to a test meter.


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