The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
May. 14, 2004
Roger W Engelbart, St. Louis, MO (US);
Reed Hannebaum, Mount Vernon, IL (US);
Steve Schrader, Bridgeton, MO (US);
Scott T Holmes, Oxford, PA (US);
Craig Walters, Wentzville, MO (US);
Roger W Engelbart, St. Louis, MO (US);
Reed Hannebaum, Mount Vernon, IL (US);
Steve Schrader, Bridgeton, MO (US);
Scott T Holmes, Oxford, PA (US);
Craig Walters, Wentzville, MO (US);
The Boeing Company, Chicago, IL (US);
Abstract
Systems and methods for identifying foreign objects and debris (FOD) and defects during fabrication of a composite structure. The system includes at least one light source positioned to emit light that illuminates a portion of the composite structure with bright field illumination and that also illuminates another portion of the composite structure with dark field illumination. The bright field illumination is reflected differently by defects in the composite structure than from portions of the composite structure that are defect free. The dark field illumination is reflected differently by FOD on the composition structure than from surfaces of the composite structure that are FOD free. The system also includes at least one camera for receiving images of the illuminated portions of the composite structure. The images received by the camera may be processed by a processor which then outputs a response identifying defects and foreign objects and debris based on the images.