The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Nov. 18, 2003
Applicants:

Eric Chapoulaud, Pasadena, CA (US);

Harvey L. Kasdan, Sherman Oaks, CA (US);

Kenneth R. Castlemen, Friendswood, TX (US);

Kenneth N. Good, Houston, TX (US);

Inventors:

Eric Chapoulaud, Pasadena, CA (US);

Harvey L. Kasdan, Sherman Oaks, CA (US);

Kenneth R. Castlemen, Friendswood, TX (US);

Kenneth N. Good, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for classifying a plurality of elements in images, where electronic images of a field of view containing elements are formed. Each of the elements has a plurality of features. A first subgroup of the plurality of features from the images of the plurality of elements are extracted and processed to segregate the plurality of elements into first and second groups. A classification class only for each of the elements in the first group is determined by selecting and processing a second subgroup of the extracted features to determine a physical characteristic of the element, and by selecting and processing a third subgroup of the extracted features in response to the determined physical characteristic to determine a classification class of the element. The second group of elements bypasses the determination of classification class.


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