The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Apr. 13, 2000
Wei Yun Yau, Singapore, SG;
Kar Ann Toh, Singapore, SG;
Xudong Jiang, Singapore, SG;
Nanyang Technological University, Singapore, SG;
Agency for Science, Technology and Research, Singapore, SG;
Abstract
A reference minutiae template comprising reference minutiae and a first partial minutiae template, which overlaps the reference minutiae template, the first partial minutiae template comprising first minutiae, are selected. The reference minutiae of the reference minutiae template are matched with the first minutiae of the first partial minutiae template. Using the matched minutiae, a transformation function is determined, which describes the relation between the reference minutiae and the first minutiae. The first minutiae, which are located outside the overlapping region, are transformed using the transformation function, thereby generating a new reference template. Furthermore, a second partial minutiae template is selected, which overlaps the new reference minutiae template, the second partial minutiae template comprising second minutiae. The method is repeated iteratively for all partial minutiae templates with the new reference minutiae template as the reference minutiae template of the next iteration, the second partial minutiae template as the first partial minutiae template of the next iteration, thereby generating the total minutiae template.