The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Apr. 08, 2005
Applicants:

Shunji Saruki, Tokyo, JP;

Kenji Inage, Tokyo, JP;

Nozomu Hachisuka, Tokyo, JP;

Hiroshi Kiyono, Tokyo, JP;

Inventors:

Shunji Saruki, Tokyo, JP;

Kenji Inage, Tokyo, JP;

Nozomu Hachisuka, Tokyo, JP;

Hiroshi Kiyono, Tokyo, JP;

Assignee:

TDK Corporation, Chuo-ku, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/455 (2006.01);
U.S. Cl.
CPC ...
Abstract

Testing a TMR element includes a step of measuring initially a resistance value of the TMR element to provide the measured resistance value as a first resistance value, a step of measuring a resistance value of the TMR element after continuously feeding a current through the TMR element from a anti-substrate side to a substrate side for a predetermined period of time, to provide the measured resistance value as a second resistance value, and a step of evaluating the TMR element by comparing the first resistance value and the second resistance value with each other.


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