The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Feb. 04, 2003
Built in full speed nonreturn to zero test method and apparatus for a data storage device controller
Applicants:
Jonathan L. Damron, Boulder, CO (US);
Hui Su, Longmont, CO (US);
Inventors:
Jonathan L. Damron, Boulder, CO (US);
Hui Su, Longmont, CO (US);
Assignee:
Seagate Technology LLC, Scotts Valley, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01); G11B 20/10 (2006.01); G11B 5/09 (2006.01); G11B 20/14 (2006.01); G11B 20/16 (2006.01); G06F 3/06 (2006.01); G06F 12/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A data storage device such as a disc drive is described that has a controller chip with an integral embedded read/write channel on the chip. The chip includes a built in test capability for testing the controller logic via the device microprocessor and a nonreturn to zero test FIFO and control logic module. The module includes an internal first in/first out buffer (FIFO) that has variable data speeds and is provided on the chip to provide the test capability thereby permitting testing that would otherwise be difficult to perform.