The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Mar. 20, 2003
Applicants:

Rintaro Nakane, Yokohama, JP;

Shigeru Fujiwara, Yokohama, JP;

Hideaki Fukaya, Chiba, JP;

Inventors:

Rintaro Nakane, Yokohama, JP;

Shigeru Fujiwara, Yokohama, JP;

Hideaki Fukaya, Chiba, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A gradation pattern is printed, the gradation pattern is corrected with a gamma correction table Tbased on a result in which the printed gradation pattern is read, the corrected gradation pattern is printed on a photosensitive drum or the like, and a measured density of the printed gradation pattern in Sis stored as a reference value of density D. Thereafter, without user's operation, at a set automatic timing, the read gradation pattern P is corrected with the gamma correction table Tand printed on the photosensitive drum or the like, density deviation ΔD between a measured density D of the printed gradation pattern in Sand the reference value of density Dis determined, and the latest gamma correction table T is generated and updated on the basis of the density deviation ΔD. Consequently, high-quality image formation can be automatically performed.


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