The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Jun. 03, 2004
Applicants:

Tomohiro Ishikawa, Rochester, NY (US);

James F. Elman, Fairport, NY (US);

David M. Teegarden, Pittsford, NY (US);

Inventors:

Tomohiro Ishikawa, Rochester, NY (US);

James F. Elman, Fairport, NY (US);

David M. Teegarden, Pittsford, NY (US);

Assignee:

Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/1335 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multilayer optical compensation film includes at least one optically anisotropic first layer and at least one optically anisotropic second layer. The indices of refraction of the first layer satisfies the relation nx1≧ny≧nz. The second layer includes amorphous polymer with a glass transition temperature above 160° C., and the indices of refraction of the second layer satisfy the relations |nx−ny|<0.001 and nz−(nx+ny)/2>0.005.


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