The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Nov. 06, 2002
Shuxue Quan, San Jose, CA (US);
Naoya Katoh, Chiba, JP;
Noboru Ohta, Rochester, NY (US);
Mitchell Rosen, Rochester, NY (US);
Shuxue Quan, San Jose, CA (US);
Naoya Katoh, Chiba, JP;
Noboru Ohta, Rochester, NY (US);
Mitchell Rosen, Rochester, NY (US);
Rochester Institute of Technology, Rochester, NY (US);
Sony Corporation, Tokyo, JP;
Abstract
A method for optimizing a selection of spectral sensitivities for an imaging device includes determining a first set of spectral sensitivities from an initial set of spectral sensitivities based on an analysis of one of a universal measure of goodness, a μ-Factor, and RMS noise. A second set of spectral sensitivities is determined from the first plurality of sets of spectral sensitivities based on an analysis of a different one of the universal measure of goodness, the μ-Factor, and the RMS noise. The second set of spectral sensitivities is an optimized set of spectral sensitivities.