The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Nov. 18, 2005
Joerg Middendorf, Neuenkirchen, DE;
Ralf Hagedorn, Neuenkirchen, DE;
Joerg Middendorf, Neuenkirchen, DE;
Ralf Hagedorn, Neuenkirchen, DE;
General Electric Company, Schenectady, NY (US);
Abstract
A functionality test method for a technical system having at least one technical component to be regularly tested. The method including the steps of defining a test interval by setting a minimum time interval and a maximum time interval between two successive tests of the technical component, defining a test range for a decision parameter, sensing an actual value of the decision parameter, and performing a functionality test of the technical component if the minimum time interval between two successive tests of the technical component has elapsed and the sensed actual value of the decision parameter is within the predefined test range, or the maximum time interval between two successive tests of the technical component has elapsed.