The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
May. 14, 2003
Applicants:
N. Joni Shah, Jülich, DE;
Maxim Zaitsev, Freiburg, DE;
Martin Osmund Leach, Surrey, GB;
David John Collins, Surrey, GB;
James D'arcy, Wolverhampton, GB;
Inventors:
N. Joni Shah, Jülich, DE;
Maxim Zaitsev, Freiburg, DE;
Martin Osmund Leach, Surrey, GB;
David John Collins, Surrey, GB;
James D'Arcy, Wolverhampton, GB;
Assignee:
Forschungszentrum Julich GmbH, Julich, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An object is examined by detecting properties of the object at different times within a space formed by spatial frequencies. This is done such that temporally consecutive recordings are made in overlapping regions of the spatial frequency space and also in regions of the spatial frequency space that differ from one another.