The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Jan. 06, 2006
Akira Nishimizu, Tokai, JP;
Tetsuya Matsui, Hitachi, JP;
Masahiro Koike, Hitachi, JP;
Yoshio Nonaka, Hitachi, JP;
Isao Yoshida, Hitachi, JP;
Akira Nishimizu, Tokai, JP;
Tetsuya Matsui, Hitachi, JP;
Masahiro Koike, Hitachi, JP;
Yoshio Nonaka, Hitachi, JP;
Isao Yoshida, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.