The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Nov. 24, 2004
Applicants:

Eli Kolodney, Haifa, IL;

Anatoly Bekkerman, Haifa, IL;

Boris Tsipinyuk, Nesher, IL;

Inventors:

Eli Kolodney, Haifa, IL;

Anatoly Bekkerman, Haifa, IL;

Boris Tsipinyuk, Nesher, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05F 3/00 (2006.01); H01J 49/14 (2006.01); B01J 19/08 (2006.01); C01B 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for the generation of anionic and neutral particulate beams is described. The apparatus comprises a duct defined by walls having an inner surface capable of sustaining a temperature above an electron emission temperature of the surface, so as to negatively charge electrically neutral particles being passed through the duct when the surface is heated to the temperature; a heating element for heating the inner surface to the temperature; and an acceleration electrode for ion-optically controlling and manipulating the negatively charged particles into the anion beam. The apparatus may further comprise a protection electrode defining a protected region, which substantially prevent emitted electrons from escaping the protected region. Moreover, a system for analyzing substances ejected from a surface of a sample bombarded with an anion beam generated by the apparatus is described. The system further comprises a detector for detecting the substances once ejected of the surface. Further, a method of generating an anion beam is described.


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