The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 26, 2007

Filed:

Nov. 18, 2002
Applicants:

Jensen Peter Akkerman, Huizen, NL;

Dan Van Der Meer, Delft, NL;

Jilles DE Wit, Delft, NL;

Frederik Nico Endtz, Rotterdam, NL;

Arend Van DE Stadt, Huizen, NL;

Bernardus Cornelis Johannes Landman, Boskoop, NL;

Inventors:

Jensen Peter Akkerman, Huizen, NL;

Dan Van Der Meer, Delft, NL;

Jilles De Wit, Delft, NL;

Frederik Nico Endtz, Rotterdam, NL;

Arend Van De Stadt, Huizen, NL;

Bernardus Cornelis Johannes Landman, Boskoop, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a device and a method for performing measurements on packagings, in particular packagings which are at least slightly worn on otherwise to a greater or lesser extent opaque to visible light, which are filled with a liquid product, wherein the packagings are irradiated with radiation in a wavelength range suitable for the packaging with product, and images of at least a part of the content of the packaging are recorded for a predetermined time by image recording means, wherein the obtained image information is analysed for information indicating the presence of undesired particles, and a part of the radiation has a frequency falling within the infrared range.


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