The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Mar. 01, 2006
Applicant:
Frank Hecht, Weimar, DE;
Inventor:
Frank Hecht, Weimar, DE;
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
Light scanning microscope with an at least single-dimensional light distribution for grid-shaped illumination of a sample in a locally limited grid field and detector means for recording sample light as well as a sample table that moves in at least one direction, whereby in a first process step an illumination of the sample, detection of sample light and data recording of the detection is carried out during a movement of the sample table in at least a first direction over the dimensions of the grid field and the recording of the respective table position is assigned to the data recording.