The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Jul. 29, 2005
Yu-chuan Shen, Hsinchu County, TW;
Yu-Chuan Shen, Hsinchu County, TW;
Novatek Microelectronics Corp., Hsinchu, TW;
Abstract
A method suitable for calibrating the deviation of opto-electronic conversion functions (OECFs) in an imaging apparatus is provided. The method of calibrating the deviation of OECFs comprises the following steps. First, the imaging apparatus captures a first image. Next, the imaging apparatus performs an image calibration process with respect to the first image to capture a second image and simultaneously obtain an OECF set. The OECF set includes at least an optical characteristic value of the second image and at least an electrical characteristic value of the imaging apparatus. Finally, the aforementioned steps are repeated to obtain a number of images and their corresponding OECF sets.