The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Dec. 03, 2004
James Norman Barshinger, Scotia, NY (US);
Richard Eugene Klaassen, West Chester, OH (US);
James Norman Barshinger, Scotia, NY (US);
Richard Eugene Klaassen, West Chester, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method of inspecting a component includes immersing the component in a coupling medium with material velocity cand immersing an ultrasonic (UT) probe having at least one transducer in the coupling medium. The UT probe has a convex lens with acoustic velocity cand an acoustic impedance less than about 2.5×10Rayls. The method further includes exciting the transducer to produce an UT pulse directed into the component and generating echo signals using the transducer as a receive element. An US inspection system includes UT probe, a pulser/receiver configured to supply signal excitation pulses to the transducer element at a pulse repetition frequency (prf) of at least about 1000 Hz and a scanner configured to scan the component with the UT probe at a scanning rate equal to the prf times a scanning increment.