The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2007

Filed:

Dec. 12, 2002
Applicants:

Lewis K. Cirne, Redwood City, CA (US);

John B. Bley, San Mateo, CA (US);

Daryl L. Puryear, San Mateo, CA (US);

David Latham, Berkeley, CA (US);

Inventors:

Lewis K. Cirne, Redwood City, CA (US);

John B. Bley, San Mateo, CA (US);

Daryl L. Puryear, San Mateo, CA (US);

David Latham, Berkeley, CA (US);

Assignee:

Computer Associates Think, Inc., Islandia, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

Potential sources of memory leaks are identified by tracking the size of groups of stored items and determining based on the growth pattern of the groups whether the groups of stored items are potential sources of memory leaks. An example of a group of stored items is an instance of a Java collection. If the growth pattern of a particular group of stored items indicates that it may be the source of a memory leak, that group is reported to a user and will continue to be tracked.


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