The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2007

Filed:

Mar. 10, 2003
Applicants:

Douglas W. Raymond, Orinda, CA (US);

Richard D. Fleming, Walnut Creek, CA (US);

John Haddon, Berkeley, CA (US);

Dominic F. Haigh, San Francisco, CA (US);

Inventors:

Douglas W. Raymond, Orinda, CA (US);

Richard D. Fleming, Walnut Creek, CA (US);

John Haddon, Berkeley, CA (US);

Dominic F. Haigh, San Francisco, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 37/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique for developing an inspection program for a circuit board to be run on an AOI system includes determining a characteristic, such as average gray level, of each window of the circuit board. The positions of the windows are varied slightly to simulate expected errors in the placement of the windows relative to the circuit board. After varying the positions of the windows, the characteristic of each window is determined again. Different values of the characteristic corresponding to slightly different positions are compared for each window. Values that substantially change for a window indicate a strong sensitivity to position. These windows may be reported to a programmer for corrective action.


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