The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2007

Filed:

Aug. 04, 2000
Applicants:

Anthony H. Aletras, Rockville, MD (US);

Han Wen, Bethesda, MD (US);

Inventors:

Anthony H. Aletras, Rockville, MD (US);

Han Wen, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
Abstract

Magnetic resonance imaging method and apparatus are provided for mapping the internal or bulk motion of an object by labeling the phase of a specimen magnetization with a selected spatial function and measuring changes in the phase of the magnetization. The spatial function is selectable to provide magnetization phase modulation corresponding to displacements in a selected direction, such as a radial or azimuthal direction. Methods and apparatus for producing images based on magnetization phase modulation acquire image data based on stimulated echos and stimulated anti-echos. In an embodiment, a series of 180 degree pulses produces alternating stimulated and stimulated anti-echos that are measured and assigned to respective images.


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