The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2007
Filed:
Aug. 31, 2004
Manfred Gilbert, Schoeffengrund, DE;
Gerhard Pfeifer, Solms, DE;
Hans-joachim Kolb, Rauschenberg, DE;
Manfred Gilbert, Schoeffengrund, DE;
Gerhard Pfeifer, Solms, DE;
Hans-Joachim Kolb, Rauschenberg, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
The present invention concerns a microscope. The microscopeencompasses a microscope stand, an objectivehaving an optical axis, a microscope stageserving to receive a specimen, and a focusing deviceserving to focus the specimen. With the focusing device, the objective or the microscope stageis positionable relative to the microscope standin the direction of the optical axisof the objective. The focusing devicecomprises at least one operating elementwith which an operator controls the positioning of the objectiveor of the microscope stage. For adaptation of the spatial arrangement of the operating elementto the needs of an operator, the microscopeaccording to the present invention is characterized in that the spatial arrangement of the operating elementrelative to the microscope standis modifiable.