The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2007

Filed:

Jan. 31, 2003
Applicants:

Tatsuhiko Obayashi, Minami-ashigara, JP;

Takafumi Hosokawa, Minami-ashigara, JP;

Kenichi Nakamura, Minami-ashigara, JP;

Atsuhiro Okawa, Minami-ashigara, JP;

Inventors:

Tatsuhiko Obayashi, Minami-ashigara, JP;

Takafumi Hosokawa, Minami-ashigara, JP;

Kenichi Nakamura, Minami-ashigara, JP;

Atsuhiro Okawa, Minami-ashigara, JP;

Assignee:

Fujifilm Corporation, Minato-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 1/11 (2006.01);
U.S. Cl.
CPC ...
Abstract

An anti-reflection film containing a high-refractive-index layer having a refractive index of 1.65 to 2.40 and a low-refractive-index layer having a refractive index of 1.20 to 1.55, wherein the high-refractive-index layer is formed by coating and hardening a coating solution composition that contains inorganic fine particles having an average particle size of 1 to 200 nm and being dispersed with a polymer having a crosslinkable group. A method of producing the anti-reflection film and an image display device provided with the anti-reflection film.


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