The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2007
Filed:
Jun. 24, 2005
Sharon Xiaorong Wang, Hoffman Estates, IL (US);
James T. Chapman, Glen Ellyn, IL (US);
Ronald E. Malmin, Chicago, IL (US);
Sharon Xiaorong Wang, Hoffman Estates, IL (US);
James T. Chapman, Glen Ellyn, IL (US);
Ronald E. Malmin, Chicago, IL (US);
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Abstract
Point source responses of pinhole apertures in a non-uniform grid mask used to spatially calibrate a gamma camera can be modeled as a two-dimensional Gaussian function with a set of seven parameters. The Gaussian parameters can be measured using a surface-fitting algorithm that seeks minimum error in the least squares sense. The process is repeated for data from each pinhole location and the data are added together to generate a complete model of the flood image from the mask, which then can be used in a peak detection process for clinical images.