The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2007

Filed:

Jul. 30, 1999
Applicants:

Daniel P. Little, Boston, MA (US);

Maryanne J. O'donnell-maloney, Boston, MA (US);

Charles R. Cantor, Boston, MA (US);

Hubert Köster, La Jolla, CA (US);

Inventors:

Daniel P. Little, Boston, MA (US);

Maryanne J. O'Donnell-Maloney, Boston, MA (US);

Charles R. Cantor, Boston, MA (US);

Hubert Köster, La Jolla, CA (US);

Assignee:

Sequenom, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 24/00 (2006.01); G01N 1/10 (2006.01); B01D 59/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for dispensing tools that can be employed to generate multi-element arrays of sample material on a substrate surface. The resulting substrates are also provided. The substrates surfaces can be flat or geometrically altered to include wells of receiving material. The tool can dispense a spot of fluid to a substrate surface by spraying the fluid from the pin, contacting the substrate surface or forming a drop that touches against the substrate surface. The tool can form an array of sample material by dispensing sample material in a series of steps, while moving the pin to different locations above the substrate surface to form the sample array. The prepared sample arrays are passed to a plate assembly that disposes the sample arrays for analysis by mass spectrometry. To this end, a mass spectrometer is provided that generates a set of spectra signals that are indicative of the composition of the sample material under analysis.


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