The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2007

Filed:

Feb. 17, 2004
Applicants:

Taisaku Kogawa, Tokyo, JP;

Nobuaki Kitajima, Tokyo, JP;

Kazuyuki Okamura, Tokyo, JP;

Inventors:

Taisaku Kogawa, Tokyo, JP;

Nobuaki Kitajima, Tokyo, JP;

Kazuyuki Okamura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/14 (2006.01); G02B 21/00 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an operation microscope where manipulations to be performed in response to switching between methods for observing an eye to be operated are performed in an interlocked manner, thereby improving manipulability. When recognizing that a change-over switch is switched to its upper position, a control circuit controls a drive apparatus so that an operator microscope is raised, controls a drive mechanism so that an optical unit is moved to an inverter-on position, changes the turned-on position of a light source so that an illumination light flux forms a small angle with respect to an observation optical axis, and controls a solenoid so that a stereo variator is moved to be arranged on an optical path of an observation light flux.


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