The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Apr. 15, 2005
Applicant:
Iain R. Clark, San Jose, CA (US);
Inventor:
Iain R. Clark, San Jose, CA (US);
Assignee:
LSI Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A circuit for parametric testing of an integrated circuit includes an integrated circuit having a plurality of input buffers and a plurality of XOR gates. The plurality of XOR gates have a first input that is connected to an output of one of the input buffers and having a second input that is connected to an output of a preceding XOR gate to form an XOR logic tree.