The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Jul. 17, 2002
James Craig Ziegler, Plympton, MA (US);
Roy Miles, Morgan Hill, CA (US);
Brent Schusheim, Wenham, MA (US);
James Craig Ziegler, Plympton, MA (US);
Roy Miles, Morgan Hill, CA (US);
Brent Schusheim, Wenham, MA (US);
LTX Corporation, Norwood, MA (US);
Abstract
A digital tester includes a digital data pattern aligner. The digital data pattern aligner includes an alignment pattern source, a data shifter, and a data comparator. The alignment pattern source sends an alignment pattern to the comparator in a data stream. The comparator samples the data stream and compares the samples to a copy of the alignment pattern. The shifter shifts the data in the data stream so long as the comparator detects no match between a data stream sample and the copy of the alignment pattern. When a match is detected, the pattern source and the comparator are in alignment and other data, such as test patterns, may be sent to the comparator or associated components.