The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2007

Filed:

Jun. 29, 2001
Applicants:

Franz Treue, Palo Alto, CA (US);

Lawrence Henry Hudepohl, Saratoga, CA (US);

Scott Michael Mccoy, Sunnyvale, CA (US);

Radhika Thekkath, Palo Alto, CA (US);

Inventors:

Franz Treue, Palo Alto, CA (US);

Lawrence Henry Hudepohl, Saratoga, CA (US);

Scott Michael McCoy, Sunnyvale, CA (US);

Radhika Thekkath, Palo Alto, CA (US);

Assignee:

Mips Technologies, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system accessible by a test access port controller via a test access port interface includes a data register. The data register is selectable based on an instruction register signal in the test access port interface. The instruction register signal is derived form an instruction register in the test access port controller. A shift register is connected to a data input and a data output in the test access port interface and to the data register. The operation of the shift register is controlled based on an indication of a state of a test access port controller state machine that is received over the test access port interface.


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