The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Oct. 26, 2006
Chih-kuang Chang, Tu-Cheng, TW;
Xin-yuan Wu, Shenzhen, CN;
Jie-rong Chen, Shenzhen, CN;
Xiao-dan Tang, Shenzhen, CN;
Min Wang, Shenzhen, CN;
Bing-gen Yang, Shenzhen, CN;
Chih-Kuang Chang, Tu-Cheng, TW;
Xin-Yuan Wu, Shenzhen, CN;
Jie-Rong Chen, Shenzhen, CN;
Xiao-Dan Tang, Shenzhen, CN;
Min Wang, Shenzhen, CN;
Bing-Gen Yang, Shenzhen, CN;
Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
A computer-based method for generating a scanning program for a stand-alone measuring equipment is provided. The method includes the steps of: receiving parameters, the parameters including output types of probing points; calculating a probing point coordinate multidimensional array; creating probing features; generating 3D program of each probing feature, and forming a control file by assimilating all 3D programs; and transferring the control file to a computer in the measuring equipment and executing the control file by utilizing measuring software in the computer to measure a workpiece. A related system is also provided.