The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Dec. 03, 2004
Applicant:
Masakazu Fujimoto, Kanagawa, JP;
Inventor:
Masakazu Fujimoto, Kanagawa, JP;
Assignee:
Fuji Xerox Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A distribution goodness-of-fit test device for testing whether measured data matches an estimated probability distribution has a counting section determination unit, a counting unit and a goodness-of-fit test unit. The counting section determination unit determines according to the number of the measured data, widths of counting sections for counting the measured data. The counting unit counts the numbers of data in the respective determined counting sections. Also, the goodness-of-fit test unit performs a goodness-of-fit test based on the numbers of data in the respective counting sections.