The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Dec. 21, 2001
Joel P. Dunsmore, Sebastopol, CA (US);
Michael Marzalek, Bodega Bay, CA (US);
Joel P. Dunsmore, Sebastopol, CA (US);
Michael Marzalek, Bodega Bay, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method for extending dynamic range and a test system with extended dynamic range compensate for a compression effect on measured data caused by a receiver channel of the test system being compressed. The measured data is magnitude and phase data for one of a device under test and a signal under test that is measured using the test system. The method comprises characterizing a first channel of the test system for first channel compression responses to magnitude and phase, characterizing a second channel of the test system for second channel compression response to magnitude and phase, and compensating to correct for the effect of compression on the measured data. The test system comprises a receiver channel, and a computer program stored in memory that implements the method. Test systems with a plurality of receiver channels may be characterized in pairs.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile