The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2007

Filed:

Oct. 28, 2003
Applicants:

Dirk Broddin, Edegem, BE;

Mario Verbruggen, Baal, BE;

Serge Tavernier, Lint, BE;

Inventors:

Dirk Broddin, Edegem, BE;

Mario Verbruggen, Baal, BE;

Serge Tavernier, Lint, BE;

Assignee:

Agfa-Gevaert N.V., Mortsel, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for reproducing an image on a carrier, the method includes: generating a conjoined first and second sub-image, each representative for a portion of the image; defining an overlap region where both sub-images give a contribution to the internal optical density of the carrier; dividing the overlap region in a partition of microdots; establishing for each sub-image a peripheral edge in the overlap region; increasing the contribution by the first sub-image from the peripheral edge of the first sub-image to the peripheral edge of the second sub-image; and assigning to at least one microdot an intermediate microscopic density different from a minimum or maximum microscopic density of microdots; wherein the contribution increases the microscopic density of the microdots by density steps smaller than half the difference between the minimum and maximum microscopic densities of the microdots.


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