The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2007

Filed:

Oct. 29, 2003
Applicant:

Eric Huber, Houston, TX (US);

Inventor:

Eric Huber, Houston, TX (US);

Assignee:

Metrica, Inc., San Antonio, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for approximating an object's pose from a camera generated image of a scene is performed by first extracting a binary map from the image. The binary map is filtered to include silhouettes of objects located within a predetermined range of distances from the camera. An initial binary shape template may be applied to the binary map to locate potential target object silhouettes. Iterative stages of binary templates are applied to the each target object silhouette that represent a range of poses of the target object. Each stage of templates has higher spatial fidelity than the previous stage and poses corresponding to templates that do not sufficiently match the silhouette are eliminated from consideration. The target object's pose is approximated based on a set of templates that best matches the target object silhouette.


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