The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Feb. 15, 2005
Applicants:
Franz Wintrich, Essen, DE;
Volker Stephan, Hüpstedt, DE;
Inventors:
Franz Wintrich, Essen, DE;
Volker Stephan, Hüpstedt, DE;
Assignee:
Powitec Intelligent Technologies GmbH, Essen, DE;
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method for monitoring a thermodynamic process in an installation, in which image material () of the process is produced and the image material () is subjected to image evaluation, an eigen value problem approach is used, at least in large part, for automatic image evaluation.
Wintrich, Franz. (2007). Method for monitoring a thermodynamic process (U.S. Patent No. 7231078). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7231078
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile