The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Jul. 02, 2003
Paul Henry Bryant, Encinitas, CA (US);
Paul Henry Bryant, Encinitas, CA (US);
Chaos Telecom, Inc., San Diego, CA (US);
Abstract
A series of time domain reflectometry (tdr) measurements are made on a channel having nonlinear impairments as well as linear impairments. In a given measurement, the reflected signals from the impairments are digitized and sequentially stored in memory. The parameters characterizing the channel are then changed, preferably by biasing the line by means of a dc current. The changed bias condition modifies the impedance of nonlinear impairments in a nonlinear manner, while the impedance of linear impairments are unchanged by the bias. A second tdr measurement is initiated, and the reflected signals digitized and sequentially stored. The two sets of stored reflected signals are then sequentially compared, and corresponding signals having either the same amplitudes or linearly proportional amplitudes are identified as reflected from linear impairments, while those not the same, nor proportional, are identified as from nonlinear impairments.