The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2007

Filed:

Jul. 27, 2004
Applicant:

Teruhiko Izumi, Osaka, JP;

Inventor:

Teruhiko Izumi, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The defect detection device includes: an amplification section for amplifying a reflection signal corresponding to the intensity of light reflected from an optical disc according to a control signal indicating recording or playback; an envelope detection section for outputting an envelope of the amplified signal; a first pulse generation section for outputting a pulse when the level of the control signal changes; an integration section for integrating the envelope; a differential signal generation section for receiving the envelope as a first input signal and the integrated results as a second input signal and outputting a differential signal corresponding to the difference between these signals; and a comparison section for comparing the differential signal with a predetermined value and outputting the results as a defect detection signal. The second input signal is changed so as to reduce the possibility that the defect detection signal may indicate the presence of a defect over the duration of the pulse.


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