The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Feb. 12, 2005
E. Frederic Herkenhoff, Orinda, CA (US);
Richard B. Alford, Concord, CA (US);
Harry L. Martin, San Ramon, CA (US);
E. Frederic Herkenhoff, Orinda, CA (US);
Richard B. Alford, Concord, CA (US);
Harry L. Martin, San Ramon, CA (US);
Chevron U.S.A. Inc., San Ramon, CA (US);
Abstract
The present invention provides a method and apparatus for arriving at true relative amplitude destretched seismic traces from stretched seismic traces. The method compensates for offset varying reflection interference effects due to normal moveout. Stretch factors β and also input spectra are determined for NMOR stretched seismic traces. Estimates are then made of stretched wavelet spectra from the input spectra. A destretched wavelet spectra is then obtained. Shaping correction factors are determined by taking the ratio of the destretched wavelet spectra to the stretched wavelet spectra and are applied to the input spectra of the stretched traces to arrive at a destretched trace spectra. True relative amplitude scaling factors are computed by taking the ratio of a true relative amplitude property of the destretched wavelet spectra to a corresponding true relative amplitude property of the stretched wavelet spectra. Finally, the true relative amplitude scaling factors are applied to the destretched trace spectra to arrive at true relative amplitude destretched seismic traces.