The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2007

Filed:

Aug. 30, 2004
Applicants:

Muhammad Ashraful Alam, West Lafayette, IN (US);

Philip W. Mason, Allentown, PA (US);

Robert Kent Smith, New Providence, NJ (US);

Inventors:

Muhammad Ashraful Alam, West Lafayette, IN (US);

Philip W. Mason, Allentown, PA (US);

Robert Kent Smith, New Providence, NJ (US);

Assignee:

Agere Systems Inc, Allentown, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is possible to predict with acceptable accuracy the time to failure of a device having a thin gate dielectric in a field effect transistor. Such prediction is based on the realization that for such thin dielectric multiple dielectric breakdown occurs before device failure ensues and that measurement of the device quiescent current flow provides the information necessary for such prediction. The ability to make reliable prediction allows improvement of device design, manufacture, and use.


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