The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Apr. 15, 2005
Applicants:
Hannu Ensio Jokinen, Oulunsalo, FI;
Stefan Kirchhoff, Dortmund, DE;
Christoph Carlhoff, Willich, DE;
Inventors:
Hannu Ensio Jokinen, Oulunsalo, FI;
Stefan Kirchhoff, Dortmund, DE;
Christoph Carlhoff, Willich, DE;
Assignee:
Specialty Minerals (Michigan) Inc., Bingham Farms, MI (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01N 21/86 (2006.01);
U.S. Cl.
CPC ...
Abstract
An improved three-dimensional (3D) measuring apparatus for scanning an object and a measurement head of a measuring apparatus and a method for using the measuring apparatus for scanning an object.
Jokinen, Hannu. (2007). Three-dimensional measuring apparatus for scanning an object and a measurement head of a three-dimensional measuring apparatus and method of using the same (U.S. Patent No. 7230724). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7230724
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile