The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Jan. 23, 2004
Chien Chou, Pei-Tou Dist., Taipei City, TW;
Yi-shin Chan, Pei-Tou Dist., Taipei City, TW;
Jheng-syong Wu, Pei-Tou Dist., Taipei City, TW;
Chien Chou, Pei-Tou Dist., Taipei City, TW;
Yi-Shin Chan, Pei-Tou Dist., Taipei City, TW;
Jheng-Syong Wu, Pei-Tou Dist., Taipei City, TW;
Other;
Abstract
In a method for measuring absorption and reduced scattering coefficients of a multiple scattering medium, a coherent light beam is outputted. The coherent light beam includes linear polarized P and S wave components having mutually orthogonal polarizations and frequencies ωP and ωS, respectively. Then, the coherent light beam is split into a signal beam and a reference beam, which include the P wave and S wave components. The signal beam is subsequently projected into the medium. Optical interference signals of the reference beam and the signal beam penetrating the medium are respectively detected and converted into heterodyne interference electrical signals. Thereafter, the two heterodyne interference electrical signals are compared to obtain amplitude attenuation and phase delay of the signal beam penetrating the medium, from which the absorption and reduced scattering coefficients of the medium at a position where the signal beam penetrated the medium are inferred.