The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2007
Filed:
Mar. 28, 2005
Satoshi Imaizumi, Hoi-gun, JP;
Satoshi Imaizumi, Hoi-gun, JP;
Nidek Co., Ltd., Gamagori-shi, JP;
Abstract
A lens meter for measuring optical characteristics of a subject lens to be measured includes at least three light sources for measurement, a projecting lens which projects measurement light bundles from the light sources onto the subject lens placed on a projecting-lens optical axis, a diaphragm having an aperture disposed at an anterior focal point of the projecting lens between the light sources and the projecting lens, and a two-dimensional photodetector photo-receiving the light bundles passing through the subject lens after passing through the aperture of the diaphragm and the projecting lens without the use of an image forming optical system, and the projecting lens is disposed so that the light sources is conjugate with the photodetector in a case where the subject lens with a specific diopter in the vicinity of 0D or a frequently-used specific diopter is placed on the optical axis.