The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2007

Filed:

Jun. 30, 2005
Applicants:

Eric S Hamby, Fairport, NY (US);

Yongsoon Eun, Webster, NY (US);

Eric M Gross, Rochester, NY (US);

Lawrence Floyd, Rochester, NY (US);

Joseph a Mastrandrea, Webster, NY (US);

Inventors:

Eric S Hamby, Fairport, NY (US);

Yongsoon Eun, Webster, NY (US);

Eric M Gross, Rochester, NY (US);

Lawrence Floyd, Rochester, NY (US);

Joseph A Mastrandrea, Webster, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G03G 15/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A closed-loop toner concentration adjustment system extends xerographic process control performance with a system and method including a first controller to adjust toner concentration (TC) in a developer of the imaging device to alter a DMA level of the imaging device, the TC being adjusted based on a TC target value; a second controller to adjust an electrostatic development field to alter the DMA level; and an adjustment logic device to adjust the TC target value based on adjustments made to the electrostatic development field. The first controller outputs a dispense amount to the developer based on a difference between a measurement of the actual TC and the TC target value, thereby adjusting the TC based on the dispense amount to the developer. The second controller adjusts the electrostatic development field based on a difference between a measurement of the actual DMA level and a DMA target value. The adjustment logic monitors the adjustments made to the electrostatic development field to determine a trend, and adjusts the TC target value based on the trend.


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