The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2007

Filed:

May. 30, 2003
Applicants:

Allen T. Christian, Tracy, CA (US);

Brent Segelke, San Ramon, CA (US);

Bernard Rupp, Livermore, CA (US);

Dominique Toppani, Fontainebleau, FR;

Inventors:

Allen T. Christian, Tracy, CA (US);

Brent Segelke, San Ramon, CA (US);

Bernard Rupp, Livermore, CA (US);

Dominique Toppani, Fontainebleau, FR;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/207 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automated macromolecular method and system for detecting crystals in two-dimensional images, such as light microscopy images obtained from an array of crystallization screens. Edges are detected from the images by identifying local maxima of a phase congruency-based function associated with each image. The detected edges are segmented into discrete line segments, which are subsequently geometrically evaluated with respect to each other to identify any crystal-like qualities such as, for example, parallel lines, facing each other, similarity in length, and relative proximity. And from the evaluation a determination is made as to whether crystals are present in each image.


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