The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2007
Filed:
Sep. 14, 2000
Markus Fleute, Saint Martin d'Heres, FR;
Stéphane Lavallee, Grenoble, FR;
Laurent Desbat, Grenoble, FR;
Markus Fleute, Saint Martin d'Heres, FR;
Stéphane Lavallee, Grenoble, FR;
Laurent Desbat, Grenoble, FR;
Universite Joseph Fourier, , FR;
Abstract
The invention concerns a method and a system for three-dimensional reconstruction of an image representing the surface contours of at least an object (), from at least a two-dimensional view of said object obtained by X-ray, which consists in: determining the position of the photographing source () in a reference repository; selecting a predefined model constituting a mean form of the object, and repeating the process until the contours of the model are such that the variations between the overhead projection rays of the contours of the two-dimensional image from the source and the model surface are minimal; selecting an orientation and a position for the model in the reference repository; then selecting a deformation of the model to modify its contours in three dimensions.